NCMS Members Senvol and Oak Ridge National Laboratory Publish Report on Pedigree Additive Manufacturing Data

Technical report titled “Collection of High Pedigree AM Data for Data Analysis and Correlation.” Senvol and the U.S. Department of Energy’s (DOE) Oak Ridge National Laboratory (ORNL) have published a technical report titled “Collection of High Pedigree AM Data for Data Analysis and Correlation.” The findings of the report stem from a two-year cooperative research […]